Rudolph launches S3000SX transparent film metrology system for 28nm and below. The small site measurement optics allow measurements of single or multi-layer films up to 30 x 30 micron. Contacts ...

Posted: Jul 29, 2016: An ultrathin, transparent oxide thin-film transistors for wearable display (Nanowerk News) With the advent of the Internet of Things (IoT) era, strong demand has grown for ...